Economics of Managing Insect Pests of Soybean

January 2024 | 24 min., 24 sec.
by Ben Thrash
University of Arkansas

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​This presentation begins with definitions and discussions of economic injury level (EIJ) and economic threshold (ET) and reviews EIJ and ET data for the corn earworm in soybean. Additional topics include yield losses from vegetative and reproductive defoliation, foliar spraying and seed treatments, natural enemies of insect pests, weather effects, and insecticide selection.

About the Presenter

Ben ThrashBen Thrash grew up on a family farm in Conway, Arkansas, that grows soybean, corn, and rice and raises cattle. He received a BS in crop management with a minor in pest management from the University of Arkansas. He also completed an MS in entomology at the University of Arkansas, working on the effects of stink bug damage on edamame soybean. Ben received his PhD from Mississippi State University, where he worked on the effects of compounding defoliation, planting date, and plant population on soybean defoliation thresholds. He is currently an Extension entomologist working primarily on row crops at the University of Arkansas Cooperative Extension Service.

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