Brian Diers is a Professor in the Crop Sciences Department at the University of Illinois. He earned his BS degree from the University of Minnesota and his MS and PhD degrees from Iowa State University. Dr. Diers leads a soybean breeding and genetics program and teaches introductory genetics. His research focuses on utilizing exotic germplasm to improve the disease and pest resistance and yield potential of soybean. A major contribution of his program has been the mapping and utilization of genes that provide resistance to soybean cyst nematode, soybean aphid, and sudden death syndrome of soybean. In addition, he is mapping genes from exotic germplasm that can increase seed yield.
